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DEF 1507B - Mod El/Dig Scan Array-Advanced |
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Associated Term:
Fall 2024
Learning Objectives: • basics of array theory • simulation approaches • impact of real-world errors and methods for array calibration • system-level impacts including bandwidth and subarraying • component technologies • emerging digital techniques • implementation of digital hardware Required Materials: This course is restricted to US citizens who are industrial and/or government employees and complete the Access Eligibility Form. Eligibility questions should be directed to 404-407-6661. Attendees must fax the Access Eligibility Form to 404-407-8691. Laptop computers will not be permitted in the classroom and storage will not be available. Technical Requirements: Books and disks with the course slides Hardware examples will be presented during the duration of the course for the student’s hands-on experience |
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